Publications
Found 2 results
Szűrők: Szerző = R. Turan [Minden szűrő visszaállítása]
"Electrical and ellipsometry study of sputtered SiO2 structures with embedded Ge nanocrystals",
Appl. Surf. Sci., vol. 254, pp. 3626-3629, 2008.
"Electrical and ellipsometry study of sputtered SiO2 structures containing Ge nanocrystals",
5th Solid State Surfaces and Interfaces, Extended Abstract Book, Smolenice, Slovakia, pp. 17-20, 2006.